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THERMAL CYCLING RELIABILITY OF LEAD-FREE SOLDERS (SAC305 AND SN3.5AG) FOR HIGH TEMPERATURE APPLICATIONS

机译:高温应用无铅焊料(SAC305和SN3.5AG)的热循环可靠性

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摘要

Eutectic tin lead was the most widely used solder interconnect in the electronics industry before the adoption of lead-free legislation. But eutectic tin lead solder has a low melting point (183C) and was not suited for some high temperature applications, such as oil and gas exploration, automotive, and defense. Hence, for these applications, the electronics industry had to rely on specialized solders.In this study, ball grid arrays (BGAs), quad flat packages (QFPs), and surface mount resistors assembled with SAC305 and Sn3.5Ag solder pastes were subjected to thermal cycling from -40C to 185C. Commercially available electroless nickel immersion gold (ENIG) board finish was compared to proprietary Sn-based board finish designed for high temperatures. The data analysis showed that the type of solder paste and board finish used did not have an impact on the reliability of BGAs. The failure site was on the package side of the solder joint. The morphology of intermetallic compounds (IMCs) formed after thermal cycling was analyzed.
机译:在通过无铅法规之前,共晶锡铅是电子行业中使用最广泛的焊料互连。但是低共熔锡铅焊料的熔点较低(183C),不适合某些高温应用,例如石油和天然气勘探,汽车和国防。因此,对于这些应用,电子行业必须依靠专门的焊料。在这项研究中,对球栅阵列(BGA),四方扁平封装(QFP)以及与SAC305和Sn3.5Ag焊膏组装在一起的表面贴装电阻器进行了测试。从-40C到185C的热循环。将市售的化学镀镍沉金(ENIG)板饰面与专为高温设计的专有Sn基板饰面进行了比较。数据分析表明,所使用的焊膏类型和电路板饰面不会影响BGA的可靠性。失效点在焊点的包装侧。分析了热循环后形成的金属间化合物(IMC)的形态。

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    George, Elviz;

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  • 年度 2010
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